DocumentCode
2727339
Title
Computer-Aided Design Methodology for Electrostatic Discharge (ESD) Protection Applications
Author
Salcedo, Javier A. ; Liu, Zhiwei ; Liou, Juin J. ; Vinson, James E.
Author_Institution
Dept. of Electr. & Comput. Eng., Central Florida Univ., Orlando, FL
fYear
2006
fDate
26-28 April 2006
Firstpage
353
Lastpage
358
Abstract
Physical mechanisms that define the triggering conditions of lateral P1N1-P2N2 structures for ESD (electrostatic discharge) protection are identified using 2D numerical simulations. The TCAD (technology computer aided design) allows for accurate prediction of the forward and reverse blocking voltages, necessary for custom ESD protection design. Symmetrical and asymmetrical dual-polarity S-type I-V characteristics are achieved for bipolar input/output ESD protection design. This is realized by using 1) tailored forward-and reverse- blocking junction configurations embedded in coupled (P1N1-P2N2)//(N 2P3-N3P1) structures, and 2) optimized adjustment of the structures´ doping implantations and isolation regions
Keywords
bipolar integrated circuits; electrostatic discharge; integrated circuit design; technology CAD (electronics); ESD protection design; TCAD; computer-aided design methodology; doping implantations regions; forward blocking voltage; isolation regions; reverse blocking voltage; technology computer aided design; Application software; Circuit simulation; Circuits and systems; Computational modeling; Design automation; Design methodology; Electrostatic discharge; Numerical simulation; Protection; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Devices, Circuits and Systems, Proceedings of the 6th International Caribbean Conference on
Conference_Location
Playa del Carmen
Print_ISBN
1-4244-0041-4
Electronic_ISBN
1-4244-0042-2
Type
conf
DOI
10.1109/ICCDCS.2006.250886
Filename
4016915
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