DocumentCode :
2727339
Title :
Computer-Aided Design Methodology for Electrostatic Discharge (ESD) Protection Applications
Author :
Salcedo, Javier A. ; Liu, Zhiwei ; Liou, Juin J. ; Vinson, James E.
Author_Institution :
Dept. of Electr. & Comput. Eng., Central Florida Univ., Orlando, FL
fYear :
2006
fDate :
26-28 April 2006
Firstpage :
353
Lastpage :
358
Abstract :
Physical mechanisms that define the triggering conditions of lateral P1N1-P2N2 structures for ESD (electrostatic discharge) protection are identified using 2D numerical simulations. The TCAD (technology computer aided design) allows for accurate prediction of the forward and reverse blocking voltages, necessary for custom ESD protection design. Symmetrical and asymmetrical dual-polarity S-type I-V characteristics are achieved for bipolar input/output ESD protection design. This is realized by using 1) tailored forward-and reverse- blocking junction configurations embedded in coupled (P1N1-P2N2)//(N 2P3-N3P1) structures, and 2) optimized adjustment of the structures´ doping implantations and isolation regions
Keywords :
bipolar integrated circuits; electrostatic discharge; integrated circuit design; technology CAD (electronics); ESD protection design; TCAD; computer-aided design methodology; doping implantations regions; forward blocking voltage; isolation regions; reverse blocking voltage; technology computer aided design; Application software; Circuit simulation; Circuits and systems; Computational modeling; Design automation; Design methodology; Electrostatic discharge; Numerical simulation; Protection; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Devices, Circuits and Systems, Proceedings of the 6th International Caribbean Conference on
Conference_Location :
Playa del Carmen
Print_ISBN :
1-4244-0041-4
Electronic_ISBN :
1-4244-0042-2
Type :
conf
DOI :
10.1109/ICCDCS.2006.250886
Filename :
4016915
Link To Document :
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