• DocumentCode
    2727339
  • Title

    Computer-Aided Design Methodology for Electrostatic Discharge (ESD) Protection Applications

  • Author

    Salcedo, Javier A. ; Liu, Zhiwei ; Liou, Juin J. ; Vinson, James E.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Central Florida Univ., Orlando, FL
  • fYear
    2006
  • fDate
    26-28 April 2006
  • Firstpage
    353
  • Lastpage
    358
  • Abstract
    Physical mechanisms that define the triggering conditions of lateral P1N1-P2N2 structures for ESD (electrostatic discharge) protection are identified using 2D numerical simulations. The TCAD (technology computer aided design) allows for accurate prediction of the forward and reverse blocking voltages, necessary for custom ESD protection design. Symmetrical and asymmetrical dual-polarity S-type I-V characteristics are achieved for bipolar input/output ESD protection design. This is realized by using 1) tailored forward-and reverse- blocking junction configurations embedded in coupled (P1N1-P2N2)//(N 2P3-N3P1) structures, and 2) optimized adjustment of the structures´ doping implantations and isolation regions
  • Keywords
    bipolar integrated circuits; electrostatic discharge; integrated circuit design; technology CAD (electronics); ESD protection design; TCAD; computer-aided design methodology; doping implantations regions; forward blocking voltage; isolation regions; reverse blocking voltage; technology computer aided design; Application software; Circuit simulation; Circuits and systems; Computational modeling; Design automation; Design methodology; Electrostatic discharge; Numerical simulation; Protection; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Devices, Circuits and Systems, Proceedings of the 6th International Caribbean Conference on
  • Conference_Location
    Playa del Carmen
  • Print_ISBN
    1-4244-0041-4
  • Electronic_ISBN
    1-4244-0042-2
  • Type

    conf

  • DOI
    10.1109/ICCDCS.2006.250886
  • Filename
    4016915