Contourlet transform-based structural similarity for image quality assessment

Author

Yang, Chun-Ling ; Wang, Fan ; Xiao, Dongqin

Author_Institution

Sch. of Electron. & Inf. Eng., South China Univ. of Technol., Guangzhou, China

Volume

4

fYear

2009

fDate

20-22 Nov. 2009

Firstpage

175

Lastpage

179

Abstract

The research on image presentation and image processing algorithms in contourlet domain has been increasingly wide and deep. Combined frequency band property of different direction and the perfect coefficient features of contourlet transform, a new method of image quality assessment based on structural similarity (SSIM) and human vision system (HVS) -CT-SSIM is proposed in this paper. Theory analysis and experimental results show that the proposed CT-SSIM is more accurate and has better correlation with the subjective assessment of human beings. Also it can easily be embedded in image processing algorithms in contourlet domain, to guide and optimize the processing algorithms.

Keywords

image processing; transforms; combined frequency band property; contourlet transform; human vision system; image presentation algorithm; image processing algorithm; image quality assessment; structural similarity; Computed tomography; Discrete wavelet transforms; Distortion measurement; Humans; Image processing; Image quality; Machine vision; PSNR; Visual system; Wavelet domain; Contourlet Transform (CT); Contourlet Transform based Structural Similarity (CT-SSIM); human visual system (HVS); structural similarity (SSIM);

fLanguage

English

Publisher

ieee

Conference_Titel

Intelligent Computing and Intelligent Systems, 2009. ICIS 2009. IEEE International Conference on

Conference_Location

Shanghai

Print_ISBN

978-1-4244-4754-1

Electronic_ISBN

978-1-4244-4738-1

Type

conf

DOI

10.1109/ICICISYS.2009.5357699

Filename

5357699