• DocumentCode
    2727517
  • Title

    Ultra-Low Voltage Nano-Scale Embedded RAMs

  • Author

    Itoh, Kiyoo

  • Author_Institution
    Central Res. Lab., Hitachi, Ltd., Tokyo
  • fYear
    2006
  • fDate
    38869
  • Firstpage
    245
  • Lastpage
    248
  • Abstract
    Ultra-low voltage nano-scale embedded RAMs are described, focusing on RAM cells and peripheral circuits. First, challenges and trends of low-voltage RAM cells are discussed in terms of signal charge, signal voltage, and noise. In addition to ECC, power-supply controls to widen the voltage margin of cells, and a fully-depleted SOI to reduce VT -variation are also investigated. Then peripheral circuits are explained in terms of leakage reduction and compensation for speed variations. Based on this, it is concluded that ultra-low voltage RAMs cannot be achieved without reducing speed variations caused by variations in VT, thus resulting in a further need for compensation circuits and new devices with reduced VT variation
  • Keywords
    embedded systems; low-power electronics; nanoelectronics; random-access storage; compensation circuits; leakage reduction; noise; peripheral circuits; signal charge; signal voltage; ultra low voltage nano-scale embedded RAM; Charge pumps; Circuit noise; Clocks; Laboratories; Logic arrays; Logic devices; Parasitic capacitance; Random access memory; Signal design; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2006 IEEE North-East Workshop on
  • Conference_Location
    Gatineau, Que.
  • Print_ISBN
    1-4244-0416-9
  • Electronic_ISBN
    1-4244-0417-7
  • Type

    conf

  • DOI
    10.1109/NEWCAS.2006.250895
  • Filename
    4016926