Title :
Ultra-Low Voltage Nano-Scale Embedded RAMs
Author_Institution :
Central Res. Lab., Hitachi, Ltd., Tokyo
Abstract :
Ultra-low voltage nano-scale embedded RAMs are described, focusing on RAM cells and peripheral circuits. First, challenges and trends of low-voltage RAM cells are discussed in terms of signal charge, signal voltage, and noise. In addition to ECC, power-supply controls to widen the voltage margin of cells, and a fully-depleted SOI to reduce VT -variation are also investigated. Then peripheral circuits are explained in terms of leakage reduction and compensation for speed variations. Based on this, it is concluded that ultra-low voltage RAMs cannot be achieved without reducing speed variations caused by variations in VT, thus resulting in a further need for compensation circuits and new devices with reduced VT variation
Keywords :
embedded systems; low-power electronics; nanoelectronics; random-access storage; compensation circuits; leakage reduction; noise; peripheral circuits; signal charge; signal voltage; ultra low voltage nano-scale embedded RAM; Charge pumps; Circuit noise; Clocks; Laboratories; Logic arrays; Logic devices; Parasitic capacitance; Random access memory; Signal design; Voltage control;
Conference_Titel :
Circuits and Systems, 2006 IEEE North-East Workshop on
Conference_Location :
Gatineau, Que.
Print_ISBN :
1-4244-0416-9
Electronic_ISBN :
1-4244-0417-7
DOI :
10.1109/NEWCAS.2006.250895