A time delay integration CMOS image sensor with online deblurring algorithm

Author

Hang Yu ; Xinyuan Qian ; Menghan Guo ; Shoushun Chen ; Kay Soon Low

Author_Institution

VIRTUS IC Design Center of Excellence, Nanyang Technol. Univ., Singapore, Singapore

fYear

2015

fDate

27-29 April 2015

Firstpage

1

Lastpage

4

Abstract

This paper presents an online deblurring (ODB) algorithm for time delay integration (TDI) CMOS image sensor (CIS) used in small remote imaging systems, where image quality is degraded due to vibration caused by different factors. The ODB algorithm can detect and compensate the image shift so as to produce sharp TDI images. A 256×8-pixel prototype chip was fabricated using a 0.18μm CIS technology, which contains 8 TDI stages, column-parallel TDI accumulation and online deblurring circuits. The 4-transistor active pixel sensor (4T-APS) is applied, with the pixel size of 6.5μm×6.5μm and the fill factor of 28%.

Keywords

CMOS image sensors; delays; image restoration; 256×8-pixel prototype chip; 4-transistor active pixel sensor; CMOS image sensor; column-parallel TDI accumulation; fill factor; image quality; online deblurring algorithm; online deblurring circuits; pixel size; size 0.18 mum; small remote imaging systems; time delay integration; vibration; Algorithm design and analysis; CMOS image sensors; Capacitors; Generators; Timing; Vibrations;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Design, Automation and Test (VLSI-DAT), 2015 International Symposium on

Conference_Location

Hsinchu

Type

conf

DOI

10.1109/VLSI-DAT.2015.7114510

Filename

7114510