DocumentCode :
2727526
Title :
A time delay integration CMOS image sensor with online deblurring algorithm
Author :
Hang Yu ; Xinyuan Qian ; Menghan Guo ; Shoushun Chen ; Kay Soon Low
Author_Institution :
VIRTUS IC Design Center of Excellence, Nanyang Technol. Univ., Singapore, Singapore
fYear :
2015
fDate :
27-29 April 2015
Firstpage :
1
Lastpage :
4
Abstract :
This paper presents an online deblurring (ODB) algorithm for time delay integration (TDI) CMOS image sensor (CIS) used in small remote imaging systems, where image quality is degraded due to vibration caused by different factors. The ODB algorithm can detect and compensate the image shift so as to produce sharp TDI images. A 256×8-pixel prototype chip was fabricated using a 0.18μm CIS technology, which contains 8 TDI stages, column-parallel TDI accumulation and online deblurring circuits. The 4-transistor active pixel sensor (4T-APS) is applied, with the pixel size of 6.5μm×6.5μm and the fill factor of 28%.
Keywords :
CMOS image sensors; delays; image restoration; 256×8-pixel prototype chip; 4-transistor active pixel sensor; CMOS image sensor; column-parallel TDI accumulation; fill factor; image quality; online deblurring algorithm; online deblurring circuits; pixel size; size 0.18 mum; small remote imaging systems; time delay integration; vibration; Algorithm design and analysis; CMOS image sensors; Capacitors; Generators; Timing; Vibrations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, Automation and Test (VLSI-DAT), 2015 International Symposium on
Conference_Location :
Hsinchu
Type :
conf
DOI :
10.1109/VLSI-DAT.2015.7114510
Filename :
7114510
Link To Document :
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