DocumentCode
2727547
Title
Perfect lens tomography
Author
Gaikovich, Konstantin P.
Author_Institution
Inst. for Phys. of Microstructures, RAS, Nizhny Novgorod, Russia
fYear
2009
fDate
June 28 2009-July 2 2009
Firstpage
1
Lastpage
4
Abstract
The method of subwavelength tomography with the use of the perfect lens (left-handed material slab) is developed. It is based on the solution of the corresponding inverse problem of electromagnetic scattering, where the special method of data acquisition is used to reduce 3D integral equations of the perturbation theory to convolution equations with respect to lateral co-ordinates. Then, the inverse problem is reduced to one-dimensional integral equation relative to the depth profile of the lateral spectrum of permittivity that is solved by Tikhonov´s method of generalized discrepancy for each pair of spectrum components. Finally the desired solution is obtained by the inverse Fourier transform. Possibilities of such tomography are studied in numerical simulation.
Keywords
convolution; electromagnetic wave scattering; integral equations; lenses; metamaterials; optical design techniques; optical tomography; 3D integral equations; Tikhonov method; convolution equations; electromagnetic scattering inverse problem; left handed material slab; perfect lens tomography; permittivity lateral spectrum; perturbation theory; subwavelength tomography; Convolution; Data acquisition; Electromagnetic scattering; Integral equations; Inverse problems; Lenses; Metamaterials; Permittivity; Slabs; Tomography; inverse problem of scattering; perfect lens; scanning tomography;
fLanguage
English
Publisher
ieee
Conference_Titel
Transparent Optical Networks, 2009. ICTON '09. 11th International Conference on
Conference_Location
Azores
Print_ISBN
978-1-4244-4825-8
Electronic_ISBN
978-1-4244-4827-2
Type
conf
DOI
10.1109/ICTON.2009.5185067
Filename
5185067
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