Title :
Scanning laser microscopy: From far field to near field
Author :
Stanciu, G.A. ; Stoichita, C. ; Stanciu, S.G.
Author_Institution :
Center for Microscopy- Microanalysis & Inf. Process., Univ. "Politeh." of Bucharest, Bucharest, Romania
fDate :
June 28 2009-July 2 2009
Abstract :
The authors present a short review on different microscopy techniques based on laser scanning microscopy. The corresponding wavelengths of the techniques cover the range from between far field (hundred nanometres) and near field (few nanometres). Our investigations started with a hundred nanometers resolution in the case of laser beam induced current technique and go to nanometre resolution in the case of near field investigations. Different techniques which we used are shortly presented.
Keywords :
OBIC; image resolution; laser beam applications; near-field scanning optical microscopy; optical images; SNOM; a-SNOM; aperture-scanning near field optical microscopy; apertureless scanning near field optical microscopy; far field-to-near field; laser beam induced current technique; nanometre resolution; scanning laser microscopy; scanning near field optical microscopy; Diffraction; Information processing; Laser beams; Laser theory; Microscopy; Nanometers; Optical propagation; Semiconductor lasers; Senior members; Transmitters; far field; laser scanning microscopy; near field; resolution;
Conference_Titel :
Transparent Optical Networks, 2009. ICTON '09. 11th International Conference on
Conference_Location :
Azores
Print_ISBN :
978-1-4244-4825-8
Electronic_ISBN :
978-1-4244-4827-2
DOI :
10.1109/ICTON.2009.5185068
