Title : 
A novel method for determining the resonance frequency of PICCs
         
        
            Author : 
Lin, Wei ; Geck, Bernd ; Eul, Hermann ; Lanschuetzer, Christian ; Raggam, Peter
         
        
            Author_Institution : 
Inst. of Radiofreq. & Microwave Eng. (HFT), Leibniz Univ. of Hanover, Hanover
         
        
        
        
        
        
            Abstract : 
The resonance frequency is a very important parameter for the characterization of PICCs. In this paper a new method for measuring the resonance frequency is presented. In spite of the widely used Real{Z} method the new transfer function method assures a well defined constant working state of the PICC during the measurement. Additionally only scalar measurements have to be performed. First the problems of the Real{Z} method are analyzed and then theory and advantages of the new method are presented by analytical calculations and simulations. Then a practical realization of the transfer function method is presented and the quality of the method is proved by measuring the resonance frequencies of passive reference devices and standard PICCs.
         
        
            Keywords : 
analogue integrated circuits; circuit resonance; frequency measurement; passive networks; radiofrequency identification; smart cards; transfer function matrices; PICC; passive reference devices; proximity integrated circuit card; real{Z} method; resonance frequency; scalar measurements; transfer function method; Coils; Frequency measurement; Impedance measurement; Magnetic field measurement; Magnetic resonance; Power measurement; Radiofrequency identification; Resonant frequency; Size measurement; Transfer functions;
         
        
        
        
            Conference_Titel : 
Communication Systems, Networks and Digital Signal Processing, 2008. CNSDSP 2008. 6th International Symposium on
         
        
            Conference_Location : 
Graz
         
        
            Print_ISBN : 
978-1-4244-1875-6
         
        
            Electronic_ISBN : 
978-1-4244-1876-3
         
        
        
            DOI : 
10.1109/CSNDSP.2008.4610795