Title :
Wavelet singularity analysis based on weighted least square method and its application
Author :
Han, Xiao-Ming ; Wang, Hua ; Tie, Zhan-Xu
Author_Institution :
Sch. of Mech. & Power Eng., Henan Polytech. Univ., Jiaozuo, China
Abstract :
When the residual of model did not agree with normal distribution or included abnormal data because of the intensive disturbed noise, the Lipschitz exponents calculated with the least square method would generate obvious deviation. In order to improve the robustness and the efficiency of the algorithm of the Lipschitz exponents of the wavelet singularity analysis, the weight function based on the least median of squares (LMS) was constructed. Further, the improved algorithm with the weighted least square method was put forward. The diagnosis results show that with the improved weighted least square method based on LMS, the Lipschitz exponents can be calculated exactly to determine the criterion avoiding the influence of the abnormal data in signals. So, the valve spring abruption fault of emulsion pump can be identified correctly and accurately. At the same time the singularities in the signals can be localized to find the impact hour of valve disc to realize the qualitative analysis of the volumetric efficiency of emulsion pump.
Keywords :
least squares approximations; normal distribution; pumps; signal processing; wavelet transforms; Lipschitz exponents; emulsion pump; intensive disturbed noise; least median of squares; normal distribution; qualitative analysis; volumetric efficiency; wavelet singularity analysis; weight function; weighted least square method; Algorithm design and analysis; Fault diagnosis; Gaussian distribution; Least squares approximation; Least squares methods; Noise generators; Noise robustness; Springs; Valves; Wavelet analysis; Least Median of Squares (LMS); Lipschitz exponents; fault diagnosis; singularity;
Conference_Titel :
Intelligent Computing and Intelligent Systems, 2009. ICIS 2009. IEEE International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-4754-1
Electronic_ISBN :
978-1-4244-4738-1
DOI :
10.1109/ICICISYS.2009.5357726