DocumentCode
2728224
Title
Nano-integrated adhesive for cryogenic packaging (4K) of harsh environment electronics
Author
John, Ranjith Samuel E ; Malshe, Ajay P. ; Dotsenko, Vladimir ; Delmas, Jean ; Webber, Robert ; Gupta, Deepnarayan
Author_Institution
Dept. of Microelectron. & Photonics, Univ. of Arkansas, Fayetteville, AR, USA
fYear
2010
fDate
1-4 June 2010
Firstpage
960
Lastpage
966
Abstract
In the current research we have developed a thermally enhanced and electrically non-conductive nano-integrated adhesive for ultra-low temperature (4K) cryogenic microelectronic packaging. Ultra-low temperature niobium based (4K) superconductor microelectronics offer the unique combination of ultrafast switching speeds (up to 100GHz), high sensitivity and low power consumption. The commercialization of these cryogenic microelectronic devices in a complex multichip module architecture where the integration of heterogeneous material and increased power density is generating a need to develop new materials and techniques to enhance the thermal and electrical performance of these ultra-low temperature superconducting microelectronic packages. In the current research, authors have investigated the thermal behavior of single-walled carbon nanotube integrated adhesive for the packaging of ultra-low-temperature (4K) electronics. Test vehicles loaded with varying concentrations of purified single-walled carbon nanotube (SWNT) integrated adhesive were characterized at 4K. The nano-integrated adhesive showed increasingly higher thermal conductivity than the pure adhesive with higher loading concentration. The thermal analysis of the nano-integrated adhesive suggests that single-walled carbon nanotube filled adhesive can play a profound role as an underfill and die attach in cryo-packaging for ultra-low temperature high density multi-chip modules (MCM).
Keywords
Carbon nanotubes; Cryogenics; Electronic packaging thermal management; Electronics packaging; Energy consumption; Microelectronics; Niobium; Superconducting materials; Temperature sensors; Thermal conductivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC), 2010 Proceedings 60th
Conference_Location
Las Vegas, NV, USA
ISSN
0569-5503
Print_ISBN
978-1-4244-6410-4
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2010.5490661
Filename
5490661
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