• DocumentCode
    2728224
  • Title

    Nano-integrated adhesive for cryogenic packaging (4K) of harsh environment electronics

  • Author

    John, Ranjith Samuel E ; Malshe, Ajay P. ; Dotsenko, Vladimir ; Delmas, Jean ; Webber, Robert ; Gupta, Deepnarayan

  • Author_Institution
    Dept. of Microelectron. & Photonics, Univ. of Arkansas, Fayetteville, AR, USA
  • fYear
    2010
  • fDate
    1-4 June 2010
  • Firstpage
    960
  • Lastpage
    966
  • Abstract
    In the current research we have developed a thermally enhanced and electrically non-conductive nano-integrated adhesive for ultra-low temperature (4K) cryogenic microelectronic packaging. Ultra-low temperature niobium based (4K) superconductor microelectronics offer the unique combination of ultrafast switching speeds (up to 100GHz), high sensitivity and low power consumption. The commercialization of these cryogenic microelectronic devices in a complex multichip module architecture where the integration of heterogeneous material and increased power density is generating a need to develop new materials and techniques to enhance the thermal and electrical performance of these ultra-low temperature superconducting microelectronic packages. In the current research, authors have investigated the thermal behavior of single-walled carbon nanotube integrated adhesive for the packaging of ultra-low-temperature (4K) electronics. Test vehicles loaded with varying concentrations of purified single-walled carbon nanotube (SWNT) integrated adhesive were characterized at 4K. The nano-integrated adhesive showed increasingly higher thermal conductivity than the pure adhesive with higher loading concentration. The thermal analysis of the nano-integrated adhesive suggests that single-walled carbon nanotube filled adhesive can play a profound role as an underfill and die attach in cryo-packaging for ultra-low temperature high density multi-chip modules (MCM).
  • Keywords
    Carbon nanotubes; Cryogenics; Electronic packaging thermal management; Electronics packaging; Energy consumption; Microelectronics; Niobium; Superconducting materials; Temperature sensors; Thermal conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2010 Proceedings 60th
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-6410-4
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2010.5490661
  • Filename
    5490661