DocumentCode :
2728424
Title :
Programmable mixed-voltage sensor readout circuit and bus interface with built-in self-test
Author :
Chavan, A.V. ; Mason, Alex ; Kang, U. ; Wise, K.D.
Author_Institution :
Delphi Delco Electron. Corp., Kokomo, IN, USA
fYear :
1999
fDate :
17-17 Feb. 1999
Firstpage :
136
Lastpage :
137
Abstract :
As integrated sensors and microactuators are combined with embedded microcontrollers to form microsystems, there is an increasing need for highly-accurate interface circuits to provide the transducers with bus compatibility, programmable control, and self-test. Several readout circuits for capacitive sensors have been reported recently, including a generic interface that has been used extensively in a multi-element microsystem. This paper reports a bus-compatible interface chip that introduces several additional features, including a programmable mixed-signal mixed-voltage switched-capacitor (SC) read-out circuit with self-test and on-line calibration capabilities. This 4.5/spl times/4.5 mm/sup 2/ chip is in a 1 /spl mu/m n-well BiCMOS 2P/2M process with high-voltage CMOS, large-value resistor, and nonvolatile memory options.
Keywords :
BiCMOS integrated circuits; built-in self test; calibration; capacitive sensors; embedded systems; microcontrollers; mixed analogue-digital integrated circuits; programmable circuits; readout electronics; switched capacitor networks; 1 micron; built-in self-test; bus compatibility; bus interface; capacitive sensors; embedded microcontrollers; integrated sensors; n-well BiCMOS 2P/2M process; nonvolatile memory options; on-line calibration; programmable control; programmable mixed-voltage circuit; sensor readout circuit; switched-capacitor circuit; BiCMOS integrated circuits; Built-in self-test; CMOS process; Calibration; Capacitive sensors; Microactuators; Microcontrollers; Programmable control; Switching circuits; Transducers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 1999. Digest of Technical Papers. ISSCC. 1999 IEEE International
Conference_Location :
San Francisco, CA
ISSN :
0193-6530
Print_ISBN :
0-7803-5126-6
Type :
conf
DOI :
10.1109/ISSCC.1999.759163
Filename :
759163
Link To Document :
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