DocumentCode :
2728577
Title :
A new drop test vehicle for a uniform shock response
Author :
Xie, Dongji ; Geiger, David ; Shangguan, Dongkai ; Hu, Billy ; Werner, Bill
Author_Institution :
Flextronics Int. USA, Milpitas, CA, USA
fYear :
2010
fDate :
1-4 June 2010
Firstpage :
902
Lastpage :
907
Abstract :
JEDEC test board is widely used in the industry to calibrate the drop performance of solder joints in BGA and other area array components. In the JEDEC test board, 15 components are usually mounted and the drop test is performed at an acceleration, typically 1500g. One main drawback for this test vehicle is that the strain of solder joint during the drop test is not uniform across all 15 components. This makes statistical and quantitative analysis of the drop test results impossible unless a large number of sample size is used. This paper proposed a smaller and square board with 4 components mounted. The finite element analysis (FEA) has shown that the solder joint strain is uniform for all components. This is very attractive as it would improve the efficiency of drop test drastically and make all data points meaningful.
Keywords :
Acceleration; Capacitive sensors; Electric shock; Finite element methods; Life estimation; Navigation; Performance evaluation; Soldering; Testing; Vehicle driving;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2010 Proceedings 60th
Conference_Location :
Las Vegas, NV, USA
ISSN :
0569-5503
Print_ISBN :
978-1-4244-6410-4
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2010.5490680
Filename :
5490680
Link To Document :
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