• DocumentCode
    2728577
  • Title

    A new drop test vehicle for a uniform shock response

  • Author

    Xie, Dongji ; Geiger, David ; Shangguan, Dongkai ; Hu, Billy ; Werner, Bill

  • Author_Institution
    Flextronics Int. USA, Milpitas, CA, USA
  • fYear
    2010
  • fDate
    1-4 June 2010
  • Firstpage
    902
  • Lastpage
    907
  • Abstract
    JEDEC test board is widely used in the industry to calibrate the drop performance of solder joints in BGA and other area array components. In the JEDEC test board, 15 components are usually mounted and the drop test is performed at an acceleration, typically 1500g. One main drawback for this test vehicle is that the strain of solder joint during the drop test is not uniform across all 15 components. This makes statistical and quantitative analysis of the drop test results impossible unless a large number of sample size is used. This paper proposed a smaller and square board with 4 components mounted. The finite element analysis (FEA) has shown that the solder joint strain is uniform for all components. This is very attractive as it would improve the efficiency of drop test drastically and make all data points meaningful.
  • Keywords
    Acceleration; Capacitive sensors; Electric shock; Finite element methods; Life estimation; Navigation; Performance evaluation; Soldering; Testing; Vehicle driving;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2010 Proceedings 60th
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-6410-4
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2010.5490680
  • Filename
    5490680