DocumentCode :
2728813
Title :
Wafer Level Reliability Screens
Author :
Maxwell, Peter
Author_Institution :
Micron Technol., Boise, ID
fYear :
2007
fDate :
20-24 May 2007
Firstpage :
201
Lastpage :
201
Abstract :
This tutorial discusses test methods and voltage stress approaches required to ensure effective cost effective defect screening to produce high quality, reliable products. Wafer level reliability screens (WLRS) refers to the application of screens during wafer test that will both activate and detect a sufficient number of defects so that early life failure rate (ELFR) is reduced enough to meet customer spec, preferably without doing burn-in. Further, these screens have to have acceptable yield loss and acceptable test times.
Keywords :
integrated circuit reliability; integrated circuit testing; early life failure rate; test methods; voltage stress approaches; wafer level reliability screens; Acceleration; Costs; Frequency; Life estimation; Life testing; Ring oscillators; Stress; Temperature; Voltage; Voltage-controlled oscillators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 2007. ETS '07. 12th IEEE European
Conference_Location :
Freiburg
Print_ISBN :
0-7695-2827-9
Type :
conf
DOI :
10.1109/ETS.2007.45
Filename :
4221596
Link To Document :
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