Title :
The Bulk Built In Current Sensor Approach for Single Event Transient Detection
Author :
Wirth, Gilson ; Fayomi, Christian
Author_Institution :
Univ. Fed. do Rio Grande do Sul, Porto Alegre
Abstract :
Radiation effects, particularly single event transients (SETs), are increasingly affecting the reliability of integrated circuits as device dimensions are scaling down. This paper presents the use of bulk built in current sensors (Bulk-BICS) for SET detection. The efficiency and applicability of the bulk-BICS approach for Single Event Transient detection is demonstrated through device and circuit level simulations.
Keywords :
electric sensing devices; integrated circuit reliability; radiation effects; transients; bulk built; circuit level simulation; current sensor approach; integrated circuit reliability; radiation effect; single event transient detection; Circuit faults; Circuit simulation; Event detection; Fault detection; Integrated circuit reliability; Logic; Monitoring; Radiation effects; Semiconductor device reliability; Voltage;
Conference_Titel :
System-on-Chip, 2007 International Symposium on
Conference_Location :
Tampere
Print_ISBN :
978-1-4244-1368-3
Electronic_ISBN :
07EX1846C
DOI :
10.1109/ISSOC.2007.4427422
