• DocumentCode
    2729351
  • Title

    Algorithm for Fast Statistical Timing Analysis

  • Author

    Salzmann, Jakob ; Sill, Frank ; Timmermann, Dirk

  • Author_Institution
    Univ. of Rostock, Rostock
  • fYear
    2007
  • fDate
    20-21 Nov. 2007
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Problems of parameter variations are a main topic in current research and will gain importance in future technology generations due to the continuing scaling. Therefore, it requires appropriate timing analysis which is traditionally done with corner-case simulations. These are quite conservative and pessimistic approaches. In contrast, new statistical static timing analysis (SSTA) algorithms offer a more accurate prediction of the timing behavior of circuit designs. Further, correlations between various parameters and devices can be observed. Unfortunately, the SSTA algorithms mostly require high computational effort and accurate library characterization. This paper proposes an approach for a fast statistical static timing analysis (F-SSTA) with moderate requirements on computation time and library characterization. The approach considers the analysis of gates with multiple inputs. The simulation results show an average error of 5% compared to Monte-Carlo simulations but a significant speed improvement of around 20 times compared to a highly accurate SSTA algorithm.
  • Keywords
    CMOS integrated circuits; Gaussian distribution; Monte Carlo methods; delays; integrated circuit design; logic gates; statistical analysis; timing; CMOS devices; F-SSTA algorithm; Gaussian distribution; Monte Carlo simulations; circuit design timing behavior prediction; fast statistical static timing analysis; gate delays; parameter variation problems; probability; Algorithm design and analysis; Analytical models; Circuit optimization; Circuit simulation; Circuit synthesis; Computational modeling; Delay estimation; Libraries; Performance analysis; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    System-on-Chip, 2007 International Symposium on
  • Conference_Location
    Tampere
  • ISSN
    07EX1846C
  • Print_ISBN
    978-1-4244-1368-3
  • Electronic_ISBN
    07EX1846C
  • Type

    conf

  • DOI
    10.1109/ISSOC.2007.4427424
  • Filename
    4427424