• DocumentCode
    2729481
  • Title

    Manufacturability and reliability study of ALX polymers for WLP applications

  • Author

    Huffman, Alan ; Garrou, Philip ; Anderson, Rex ; Rogers, Boyd

  • Author_Institution
    RTI Int., Research Triangle Park, NC, USA
  • fYear
    2010
  • fDate
    1-4 June 2010
  • Firstpage
    1794
  • Lastpage
    1797
  • Abstract
    We present the results of study on the manufacturability and reliability of ALX211 polymer in wafer level packaging processes and structures. Previously, we studied the processing windows of ALX211 polymer, where process parameters were studied in lab conditions. The typical manufacturing environment differs from the laboratory environment in that delays between processing steps are typical and unavoidable. Determining the impact of these delays on the stability of the process is critical for determining how the material will perform in a manufacturing line. In this paper, we present new data on the impact of hold times between the main process sequences for the ALX211 process and show that the process is stable with hold times up to 24 hours between process steps. In addition, we present reliability results comparing the performance of polyimide, BCB, and ALX211 as evaluated in a bump-on-polymer test structure. Results of bump shear tests after process completion and after exposure to multiple reflow cycles are presented, as well as results of board level temperature cycling testing.
  • Keywords
    Adhesives; Delay; Dielectric materials; Manufacturing processes; Moisture; Polyimides; Polymer films; Temperature; Testing; Wafer scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2010 Proceedings 60th
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-6410-4
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2010.5490725
  • Filename
    5490725