DocumentCode :
2729490
Title :
Phase Transitions for Mutual Information
Author :
Kumar, K. Raj ; Pakzad, Payam ; Salavati, Amir Hesam ; Shokrollahi, Amin
Author_Institution :
Lab. d´´algorithmique, Ecole Polytech. Fed. de Lausanne, Lausanne, Switzerland
fYear :
2010
fDate :
6-10 Sept. 2010
Firstpage :
137
Lastpage :
141
Abstract :
We consider ensembles of binary linear error correcting codes, obtained by sampling each column of the generator matrix G or parity check matrix H independently from the set of all binary vectors of weight d (of appropriate dimension). We investigate the circumstances under which the mutual information between a randomly chosen codeword and the vector obtained after its transmission over a binary input memoryless symmetric channel (BIMSC) C is exactly n times the capacity of C, where n is the length of the code. For several channels such as the binary symmetric channel (BSC) and the binary-input additive white Gaussian noise (AWGN) channel, we prove that the probability of this event has a threshold behaviour, depending on whether n/k is smaller than a certain quantity (that depends on the particular channel C and d), where k is the number of source bits. To show this, we prove a generalization of the following well-known theorem: the expectation of the size of the right kernel of G has a phase transition from 1 to infinity, depending on whether or not n/k is smaller than a certain quantity depending on the chosen ensemble.
Keywords :
AWGN channels; error correction codes; matrix algebra; binary input memoryless symmetric channel; binary linear error correcting codes; binary symmetric channel; binary vectors; binary-input additive white Gaussian noise channel; generator matrix; mutual information; parity check matrix; phase transitions; threshold behaviour; Continuous wavelet transforms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Turbo Codes and Iterative Information Processing (ISTC), 2010 6th International Symposium on
Conference_Location :
Brest
Print_ISBN :
978-1-4244-6744-0
Electronic_ISBN :
978-1-4244-6745-7
Type :
conf
DOI :
10.1109/ISTC.2010.5613821
Filename :
5613821
Link To Document :
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