Title :
Advanced Test Methodology and Strategies for Semiconductors
Author :
West, Burnell G.
Author_Institution :
Credence Syst., Milpitas, CA
Abstract :
The seemingly relentless progress of Moore´s law recently transformed the basic nature of semiconductor test. Today the focus on the high-end devices is evolving from precise measurement to data management. A transaction-based ATE architecture is therefore described
Keywords :
automatic test equipment; integrated circuit testing; Moore law; advanced test methodology; automatic test equipment; high end devices; semiconductors strategies; Boolean functions; Circuit testing; Computer architecture; Degradation; Integrated circuit interconnections; Lifting equipment; Logic devices; Quality assurance; Semiconductor device testing; System testing;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits, 2006. 13th International Symposium on the
Conference_Location :
Singapore
Print_ISBN :
1-4244-0205-0
Electronic_ISBN :
1-4244-0206-9
DOI :
10.1109/IPFA.2006.251011
