DocumentCode
2729619
Title
Improvement of the solder joint strength in a SAC 305 solder ball to a ENIG substrate using LF hydrogen radical treatment
Author
Jo, Seung Jae ; Lee, Ah Ruem ; Kang, Chung Yun
Author_Institution
Nat. Core Res. Center (NCRC) for Hybrid Mater. Solution, Pusan, South Korea
fYear
2010
fDate
1-4 June 2010
Firstpage
1752
Lastpage
1756
Abstract
Joint strength between solder ball and pad on the substrate is one of the major factors which have effects on the electronic device reliability. To improve the strength of the solder joint, the efforts evaluation surface cleaning, heat treatment and change of solder composition have been in progress. This paper discussed a solder ball joint strength improvement using low frequency hydrogen radical surface treatment and focused on the effects of surface treatment conditions on the interfacial reaction and the shear strength of the solder ball. The shear strength between the solder ball and the pad increased about 30% in comparison with no treatment under the same reflow condition. Especially, at a treatment time of 5 minutes, the shear strength considerably increased by 70% and the fracture mode of the shear test changed from interfacial fracture to the solder fracture.
Keywords
heat treatment; shear strength; solders; substrates; ENIG substrate; LF hydrogen radical treatment; SAC 305 solder ball; electronic device reliability; evaluation surface cleaning; heat treatment; interfacial fracture; interfacial reaction; low frequency hydrogen radical surface treatment; shear strength; shear test; solder ball joint strength; solder composition; solder fracture6; solder joint strength; surface treatment condition; Frequency; Heat treatment; Hydrogen; Plasma applications; Plasma confinement; Plasma sources; Soldering; Surface cleaning; Surface contamination; Surface treatment;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC), 2010 Proceedings 60th
Conference_Location
Las Vegas, NV
ISSN
0569-5503
Print_ISBN
978-1-4244-6410-4
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2010.5490735
Filename
5490735
Link To Document