Title :
Characterization of a Burn-in Failure Caused by a Defective Source Driver on TFT-LCD Panel
Author :
Wang, F.S.C. ; Lin, Keh-La ; Tso, Ko-Yang ; Chao, Chin-Chieh ; Wang, Wai William ; Yu, Alan ; Lee, C.Y. ; Kuo, Chien Hung ; Wang, C. W Arex ; Chiu, Yi
Author_Institution :
Raydium Semicond. Corp., Hsin-Chu
Abstract :
This paper describes a thorough investigation to identify the root cause of an LCD panel burn-in failure induced by an LCD source driver, which is observed in a large-scale LCD factory producing more than one million LCD panels per month. The investigation demonstrates the effectiveness of the circuit simulation to precisely locate the defective spot which is caused by a metal slice originated from outer rings of an LCD COG (chip-on-glass) source driver. With the aid of emission microscope (EMMI), energy dispersive analysis X-ray (EDAX), and chip probing (CP) tester, the root cause of the failure is well explained. The formation mechanism of metal slice from the outer rings is thoroughly studied. A solution to completely eliminate the source of metal slices from the outer rings during wafer processing is also proposed
Keywords :
driver circuits; failure analysis; liquid crystal displays; thin film transistors; LCD panel burn-in failure; LCD source driver; TFT-LCD panel; chip probing; chip-on-glass; circuit simulation; emission microscope; energy dispersive analysis X-ray; liquid crystal displays; Chaos; Circuit testing; Computer displays; Control engineering; Driver circuits; Failure analysis; Gold; Liquid crystal displays; Production facilities; Voltage; ATE; Bit-line defect; COG; CP; DVS; EDAX; EMMI; LCD driver; TFT-LCD; source driver; two-step DAC;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits, 2006. 13th International Symposium on the
Conference_Location :
Singapore
Print_ISBN :
1-4244-0205-0
Electronic_ISBN :
1-4244-0206-9
DOI :
10.1109/IPFA.2006.251023
