• DocumentCode
    2729793
  • Title

    Bypassing the short-circuit faults in the switch-ladder multi-level inverter

  • Author

    Esfandiari, Ehsan ; Bin Mariun, Norman

  • Author_Institution
    Electron. & Electr. Eng. Dept., Islamic Azad Univ., Esfahan, Iran
  • fYear
    2011
  • fDate
    25-28 Sept. 2011
  • Firstpage
    128
  • Lastpage
    132
  • Abstract
    A new hardware strategy is proposed to increase the reliability of the Switch-Ladder multi-level inverter against short-circuit (S.C.) faults in the H-Bridge and main switches´ Blocks. The strategy includes passive and active bypassing. Passive bypassing approach hires fuses in series-connection with the ladder`s steps. Instead, in the active method, relays are replaced the fuses and receive commands from a controller that monitors the short-circuit failures continuously. When a switch fails in short circuit behaviour, the ladder contains the failed switch is converted to open-circuit (O.C.). Owning to the ability of Switch-Ladder multi-level inverter to tolerate open-circuit faults due to its configuration and switching strategy, reliability is increased against short-circuit failures through inverting the short-circuit to open-circuit. At last the experimental result validates the claims.
  • Keywords
    circuit reliability; fault diagnosis; invertors; ladder networks; relays; H-bridge switch; SC faults; active bypassing approach; active method; hardware strategy; ladder steps; open-circuit faults; passive bypassing approach; relays; short circuit behaviour; short-circuit failures; short-circuit faults; switch-ladder multilevel inverter reliability; switching strategy; Circuit faults; Fuses; Industrial electronics; Inverters; Reliability; Switches; active; bypassing; passive; switch-ladder multi-level inverter;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics and Applications (ISIEA), 2011 IEEE Symposium on
  • Conference_Location
    Langkawi
  • Print_ISBN
    978-1-4577-1418-4
  • Type

    conf

  • DOI
    10.1109/ISIEA.2011.6108682
  • Filename
    6108682