• DocumentCode
    2730286
  • Title

    Neural network modeling to predict quality and reliability for BGA solder joints

  • Author

    Meyer, Sebastian ; Wohlrabe, Heinz ; Wolter, Klaus-Jurgen

  • Author_Institution
    Electron. Packaging Lab., Tech. Univ. Dresden, Dresden, Germany
  • fYear
    2010
  • fDate
    1-4 June 2010
  • Firstpage
    1596
  • Lastpage
    1603
  • Abstract
    Quality is major competitive advantages in today´s business environment. Engineering tasks encompasses the assurance of quality and reliability. Therefore, one goal is the prediction and modeling of quality and later on reliability of systems, subsystems and components. An approach of quality and reliability assurance uses failure prevention and process control, which by itself is based on quality data and technological understanding. The bases for quality and reliability prediction are information about used materials, design parameters and process parameters as well as the underlying relationships. Analyzing these data for underlying relationships between control parameters (materials and process setups), monitoring parameters (such as humidity) and target variables is one approach to assure quality output. Within this paper neural networks for analyzing relationships are investigated. Two types of neural networks are investigated which are namely back propagation networks (BPNN) and secondly radial basis function networks (RBFNN). The test objects are BGA solder joints which are manufactured using different process setups and materials. As quality measure the ratio of voids in a solder joint is used. The criterion for good prediction quality is the ability of generalization of the depicted models when applying new data to it.
  • Keywords
    Condition monitoring; Data analysis; Humidity control; Materials reliability; Neural networks; Predictive models; Process control; Process design; Reliability engineering; Soldering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2010 Proceedings 60th
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-6410-4
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2010.5490772
  • Filename
    5490772