Title :
Dynamic Optical Techniques for IC Debug and Failure Analysis
Author :
Ferrigno, Julie ; Desplats, Romain ; Perdu, Philippe ; Sanchez, Kevin ; Beaudoin, Félix ; Lewis, Dean
Author_Institution :
Dept. of Electron. Anal., CNES, Toulouse
Abstract :
Optical techniques (light emission and laser stimulation techniques) are routinely used for precise IC defect localization. At the early stage of an analysis, choosing the right technique is an increasingly complex task. In some cases, one technique may bring value but no the others. Using an 180nm test structure device we present results showing the complementary of emission microscopy (EMMI), time-resolved emission (TRE) and dynamic laser stimulation (DLS) in order to help failure analyists or debug engineers to choose the right approach
Keywords :
failure analysis; integrated circuit reliability; integrated circuit testing; 180 nm; defect localization; dynamic laser stimulation; dynamic optical techniques; emission microscopy; failure analysis; integrated circuit debug; light emission; time-resolved emission; Automotive engineering; Circuit testing; Failure analysis; Microscopy; Photonic integrated circuits; Ring lasers; Stimulated emission; System testing; Timing; Vehicle dynamics;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits, 2006. 13th International Symposium on the
Conference_Location :
Singapore
Print_ISBN :
1-4244-0205-0
Electronic_ISBN :
1-4244-0206-9
DOI :
10.1109/IPFA.2006.250980
