Title :
Access optimizer to overcome the "future walls of embedded DRAMs" in the era of systems on silicon
Author :
Watanabe, Toshio ; Ayukawa, Keiji ; Miura, Shun ; Toda, Masayoshi ; Iwamura, Takuya ; Hoshi, Keika ; Sato, Jun ; Yanagisawa, Kei
Author_Institution :
Central Res. Lab., Hitachi Ltd., Tokyo, Japan
Abstract :
This paper proposes an "access optimizer", a logic attachment for embedded DRAMs, which solves issues in the coming era of systems on silicon. The current embedded DRAM architecture relying on its large number of I/O lines will inherently face new walls. The long first access time causes the bottleneck between an on-chip CPU and an embedded-DRAM macro. The access conflict with the increase of embedded-DRAM masters will significantly degrade the chip performance.
Keywords :
DRAM chips; circuit optimisation; embedded systems; memory architecture; DRAM architecture; access conflict; access optimizer; embedded DRAMs; first access time; logic attachment; systems on silicon; Central Processing Unit; Degradation; Delay; Digital signal processing chips; Laboratories; Large scale integration; Logic; Prefetching; Random access memory; Silicon;
Conference_Titel :
Solid-State Circuits Conference, 1999. Digest of Technical Papers. ISSCC. 1999 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-5126-6
DOI :
10.1109/ISSCC.1999.759300