Title :
External electrical and optical effects in the operation of monolithic mode-locked laser diodes and the potential of nanostructure technologies in reducing these effects
Author :
Avrutin, Eugene ; Russell, Benjamin M.
Author_Institution :
Dept. of Electron., Univ. of York, York, UK
fDate :
June 28 2009-July 2 2009
Abstract :
The effects of the electrical parasitics and external optical reflections on the dynamic regimes and spectral properties of Fabry-Perot and Distributed Bragg Reflector monolithic mode-locked laser diodes are investigated numerically. Reduction of the range of stable mode-locking by the screening of the applied electric field by photocarriers accumulated due to the finite absorber circuit response time is investigated. External optical feedback above a certain critical value is shown to affect the laser dynamic drastically, potentially resulting in a wide range of dynamic regimes depending on the external reflector strength and position and in most cases severely degrading the laser performance, in agreement with experimental findings. The potential of some methods of reducing unwanted external electrical and optical effects, including the use of nanostructures such as deep-etched reflectors and Quantum Dot active media, is discussed.
Keywords :
Bragg gratings; laser mode locking; light reflection; semiconductor lasers; Fabry-Perot; deep-etched reflectors; distributed Bragg reflector; electrical effects; electrical parasitics; finite absorber circuit response time; monolithic mode-locked laser diodes; optical effects; optical feedback; optical reflections; photocarriers; quantum dot active media; Circuits; Delay; Diode lasers; Distributed Bragg reflectors; Fabry-Perot; Laser feedback; Laser mode locking; Optical feedback; Optical reflection; Quantum dot lasers; diode lasers; mode-locked lasers; optical feedback; optical isolation; quantum dots;
Conference_Titel :
Transparent Optical Networks, 2009. ICTON '09. 11th International Conference on
Conference_Location :
Azores
Print_ISBN :
978-1-4244-4825-8
Electronic_ISBN :
978-1-4244-4827-2
DOI :
10.1109/ICTON.2009.5185254