DocumentCode :
2731230
Title :
Effect of deposition time SnO2 thin film deposited using thermal CVD for humidity sensor application
Author :
Sin, N. D Md ; Kamaruddin, S.A. ; Musa, M.Z. ; Rusop, M.
Author_Institution :
NANO-Electron. Centre, Univ. Teknol. MARA, Shah Alam, Malaysia
fYear :
2011
fDate :
25-28 Sept. 2011
Firstpage :
459
Lastpage :
462
Abstract :
The effect of SnO2 thin film thickness as humidity sensor application has been investigated. In this paper, Humidity sensitivity of SnO2 thin film at different thickness deposited by thermal chemical vapor deposition were presented. The electrical, optical and structural properties of SnO2 thin film deposited at different deposition time using thermal chemical vapor deposition (CVD) were investigated. The thin films were characterized using current-voltage (I-V) measurement (Keithley 2400) and photoluminescence (PL) measurement (Horiba Jobin Yvon-DU420A-OE-325 system) for electrical and optical properties respectively. The structural propeties has been characterized using field emmision scanning electron microscopy (FESEM) (JEOL JSM 6701F). The humidity measurement were conducted on Au metal contact deposited on SnO2 thin film that connected to a circuit using copper wire. The sensor were characterized using I-V measurement (Keithley 2400) in a humidity chamber (ESPEC SH-261) and the chamber has been set at same room temperature (25 °C) but different percent relative humidity (RH %) at 40 RH% to 90 RH. Deposition time for 60 minutes show high sensitivity . PL measurement revealed one peak at about between range red emission for all thin film. FESEM image show SnO2 nanoparticle growth on the nucleation site of gold catalyst.
Keywords :
chemical vapour deposition; electrical conductivity; field emission electron microscopy; humidity sensors; photoluminescence; scanning electron microscopy; thin films; tin compounds; FESEM; SnO2; current-voltage property; electrical conductivity; electrical properties; field emmision scanning electron microscopy; humidity sensitivity; optical properties; photoluminescence; structural properties; temperature 293 K to 298 K; thermal CVD; thermal chemical vapor deposition; thin film; Gold; Humidity; Semiconductor device measurement; Sensitivity; Surface treatment; Temperature measurement; Temperature sensors; Electrical Properties; Optical Properties; Sensitivity Humidity Sensor; SnO2 Thin Film; Structural Properties;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics and Applications (ISIEA), 2011 IEEE Symposium on
Conference_Location :
Langkawi
Print_ISBN :
978-1-4577-1418-4
Type :
conf
DOI :
10.1109/ISIEA.2011.6108752
Filename :
6108752
Link To Document :
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