• DocumentCode
    2731231
  • Title

    Cu pillars on substrates — a low cost alternative for the next generation of Flip Chip packaging technology

  • Author

    Gupta, D. ; Sato, H. ; Nakadaira, Y.

  • Author_Institution
    Tessera Inc., San Jose, CA, USA
  • fYear
    2010
  • fDate
    1-4 June 2010
  • Firstpage
    1422
  • Lastpage
    1428
  • Abstract
    As the stress coupling in organic Flip Chip packages become more critical due to the introduction of brittle materials and continued pitch shrink, various technologies are emerging to manage or reduce thermal mismatch stresses. In this regard pillar bumps on the die side have had a good start as they also address underfill flow at shrunk pitch as well as electromigration during operation. Pillar bumps on the substrate side is a worthy alternative as they can leverage the capabilities of the substrate industry. Pillar bump technologies such as Tessera´s μPILR use a unique non -plating process to deposit bumps on substrates to create pillar bumps that are intrinsically co — planar, do not require solder on the bond pads and alter the crack initiation sites and propagation path favorably. These μPILR bumps are deposited on stock organic Flip Chip substrates using tools and processes commonly available to the PCB industry. Using build up panels with differing characteristics from three established suppliers of flip chip substrates, a 150 μm pitch version of μPILR technology has been developed at pilot plant level to a yield greater than 70 %. Units assembled with low — k die and substrates using several designs of μPILR interconnects and heat — spreaders have been tested for reliability (TC, EM) with encouraging results.
  • Keywords
    Assembly; Bonding; Costs; Electromigration; Flip chip; Organic materials; Packaging; Technology management; Thermal management; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2010 Proceedings 60th
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-6410-4
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2010.5490815
  • Filename
    5490815