Title :
Self-assembly technology for reconfigured wafer-to-wafer 3D integration
Author :
Fukushima, T. ; Iwata, E. ; Lee, K. -W ; Tanaka, T. ; Koyanagi, M.
Author_Institution :
Dept. of Bioeng. & Robot., Tohoku Univ., Sendai, Japan
Abstract :
We have introduced a new 3D stacking technology called reconfigured wafer-to-wafer 3D integration using surface tension-powered multichip self-assembly and multichip transfer techniques. Many Si chips were simultaneously self-assembled to a carrier wafer named “reconfigured wafer”. High-precision chip alignment with sub-micron-scale accuracy can be realized by optimizing self-assembly conditions. In addition, we developed a new self-assembled multichip bonder to three-dimensionally stack many known good dies (KDGs) on 8-inch wafers at the wafer level. By using the equipment, the many self-assembled Si chips were transferred to another target wafer in batch.
Keywords :
Assembly; Fabrication; Large scale integration; Production; Self-assembly; Stacking; Three-dimensional integrated circuits; Throughput; Wafer bonding; Wires;
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2010 Proceedings 60th
Conference_Location :
Las Vegas, NV, USA
Print_ISBN :
978-1-4244-6410-4
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2010.5490830