• DocumentCode
    2731589
  • Title

    Input-input relationship constraints in T-way testing

  • Author

    Othman, Rozmie R. ; Zamli, Kamal Z.

  • Author_Institution
    Sch. of Comput. & Commun., Univ. Malaysia Perlis (UniMAP), Kangar, Malaysia
  • fYear
    2011
  • fDate
    25-28 Sept. 2011
  • Firstpage
    527
  • Lastpage
    531
  • Abstract
    T-way testing is designed to detect faults due to interaction. In order to be effective, all t combinations of input parameters must be tested. While many t-way strategies can be used to generate the t-way test data (e.g. IPOG, AETG, GT-Way, Jenny, TVG and MIPOG), most do not ensure that all t combinations of input parameters can be practically tested. Addressing this issue, this paper highlights a new type of constraints that might prevent some t-way parameter interactions from being tested (and hence compromising the effectiveness of t-way testing), termed input-input relationship constraints. Apart from ensuring all t combinations are properly tested, input-input relationship constraints can further optimize the generated test data since all impossible combinations are completely ignored. In addition, this paper also introduces a new strategy that supports input-input relationship constraints and demonstrates the correctness of the strategy as well as the effectiveness of test data with input-input relationship.
  • Keywords
    automatic testing; generated test data; input-input relationship constraints; t-way testing; Educational institutions; Generators; Hardware; Software; Software testing; combinatorial testing; input-input relationship; interaction testing; t-way testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics and Applications (ISIEA), 2011 IEEE Symposium on
  • Conference_Location
    Langkawi
  • Print_ISBN
    978-1-4577-1418-4
  • Type

    conf

  • DOI
    10.1109/ISIEA.2011.6108767
  • Filename
    6108767