Title :
Robustness of synchronization in coupled Chua´s circuits
Author :
Zhong, G.Q. ; Ko, K.T. ; Man, K.F.
Author_Institution :
Dept. of Electron. Eng., City Univ. of Hong Kong, Kowloon, Hong Kong
Abstract :
This paper addresses the robustness in synchronization by perturbating the system parameters. Both mutually and unidirectionally coupled Chua´s circuits have been used for this investigation. The results obtained from numerical computation have been found that the coupled systems is in its most robust form when the state variable z only is used for coupling, whereas the state variable z is found to be otherwise. This paper reports a thorough investigation into the effectiveness of the parametric variations and a number of critical regions have been defined for the classification of the chaos within the context of synchronization
Keywords :
Chua´s circuit; chaos; synchronisation; chaos classification; coupled Chua´s circuits; critical regions; numerical computation; parametric variations; state variable; synchronization robustness; system parameters perturbation; Capacitors; Chaos; Chaotic communication; Context; Coupling circuits; Equations; Inductors; Mutual coupling; Resistors; Robustness;
Conference_Titel :
Industrial Electronics, 1998. Proceedings. ISIE '98. IEEE International Symposium on
Conference_Location :
Pretoria
Print_ISBN :
0-7803-4756-0
DOI :
10.1109/ISIE.1998.711562