Title :
Fault simulation of built-in tester for CMOS switched-current circuits
Author :
Wang, Jin-Sheng ; Huang, Wei-Hsing ; Wey, Chin-Long
Author_Institution :
Dept. of Electr. Eng., Michigan State Univ., East Lansing, MI, USA
Abstract :
This paper presents a built-in tester that enhances the testability of CMOS switched-current circuits and simplifies their test generation process. The tester is comprised of a high accuracy current comparator, a voltage winder comparator, and a digital latch. In this study, a high accuracy current comparator which is capable of autozeroing and self-testing is developed. The autozeroing property increases the accuracy of the tester. This paper demonstrates the self-testability of the tester through a fault simulation
Keywords :
CMOS integrated circuits; built-in self test; comparators (circuits); fault simulation; integrated circuit testing; mixed analogue-digital integrated circuits; switched current circuits; CMOS switched-current circuits; autozeroing; built-in tester; current comparator; digital latch; fault simulation; self-testability; self-testing; test generation process; testability; voltage winder comparator; Automatic testing; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Integrated circuit interconnections; Switched capacitor circuits; Switching circuits; Switching converters; Threshold voltage;
Conference_Titel :
Circuits and Systems, 1998. Proceedings. 1998 Midwest Symposium on
Conference_Location :
Notre Dame, IN
Print_ISBN :
0-8186-8914-5
DOI :
10.1109/MWSCAS.1998.759471
