• DocumentCode
    2732086
  • Title

    Vertically aligned carbon nanotubes for thermal interface materials: Quality control, alignment improvement and laser flash measurement

  • Author

    Lin, Wei ; Wong, C.P.

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2010
  • fDate
    1-4 June 2010
  • Firstpage
    967
  • Lastpage
    972
  • Abstract
    Thermal interface materials based on vertically aligned carbon nanotubes were measured systematically by a laser flash technique. An important modification has been made to the sample structure for the laser flash measurement. Influences of carbon nanotube quality, tip entanglement, alignment and packing density on the overall thermal resistance were discussed.
  • Keywords
    Carbon nanotubes; Contact resistance; Electrical resistance measurement; Optical materials; Organic materials; Phased arrays; Quality control; Silicon; Thermal conductivity; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2010 Proceedings 60th
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-6410-4
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2010.5490863
  • Filename
    5490863
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2732086