Title :
Near-field sounding of multilayered media
Author :
Gaikovich, Peter K.
Author_Institution :
Inst. for Phys. of Microstructures, RAS, Nizhny Novgorod, Russia
fDate :
June 28 2009-July 2 2009
Abstract :
A method of the coherent near-field sounding of layers´ parameters of a multilayered dielectric is proposed. It is based on the field measurements with the use of subwavelength probes (emitting and receiving) that are spaced above the upper layer of the studied structure. It makes possible to achieve a subwavelength resolution at the control of the layers´ depth. The developed approach can be used, for instance, for the monitoring of epitaxy of multilayered heterostructures using SNOM techniques.
Keywords :
acoustic wave effects; dielectric materials; multilayers; near-field scanning optical microscopy; SNOM techniques; coherent near-field sounding; multilayered dielectric; multilayered heterostructures; multilayered media; subwavelength probes; subwavelength resolution; Dielectric measurements; Epitaxial growth; Green function; Impedance; Interferometry; Microstructure; Monitoring; Nonhomogeneous media; Physics; Probes; dielectric; multilayered structures; near-field sounding;
Conference_Titel :
Transparent Optical Networks, 2009. ICTON '09. 11th International Conference on
Conference_Location :
Azores
Print_ISBN :
978-1-4244-4825-8
Electronic_ISBN :
978-1-4244-4827-2
DOI :
10.1109/ICTON.2009.5185299
