Title :
BVCER - Increased Operating Voltage for SiGe HBTs
Author :
Kraft, Jochen ; Löffler, Bernhard ; Ribic, Nikolaus ; Wachmann, Ewald
Author_Institution :
Austriamicrosyst. AG, Unterpremstatten
Abstract :
SiGe-heterojunction bipolar transistors (HBTs) still sustain their leading RF-application position due to their good noise and HF properties. They also offer a relatively high operating voltage, which is limited by BVCEO, the emitter collector breakdown voltage with open base. We show that BVCER, the avalanche breakdown with a resistor RB connected to the base, can be used to define reliable operating conditions exceeding BVCEO. The measured BVCER data correlate very well with values calculated from basic transistor parameters and their corresponding multiplication factor data. The functionality of this concept is verified by investigating a power amplifier circuit used at emitter collector voltages exceeding BV CEO in operational mode enabling significant higher output power
Keywords :
Ge-Si alloys; avalanche breakdown; heterojunction bipolar transistors; semiconductor device breakdown; semiconductor device reliability; HBT operating voltage; SiGe; avalanche breakdown; emitter collector breakdown voltage; heterojunction bipolar transistors; high operating voltage; multiplication factor data; power amplifier circuit; Avalanche breakdown; Bipolar transistors; Breakdown voltage; Circuits; Hafnium; High power amplifiers; Operational amplifiers; Power amplifiers; Power generation; Resistors; BVCBO; BVCEO; BVCER; HBT; SiGe; avalanche multiplication; breakdown voltage; hetero bipolar transistor; impact ionisation; safe operating area;
Conference_Titel :
Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-9498-4
Electronic_ISBN :
0-7803-9499-2
DOI :
10.1109/RELPHY.2006.251270