DocumentCode
2732303
Title
BVCER - Increased Operating Voltage for SiGe HBTs
Author
Kraft, Jochen ; Löffler, Bernhard ; Ribic, Nikolaus ; Wachmann, Ewald
Author_Institution
Austriamicrosyst. AG, Unterpremstatten
fYear
2006
fDate
26-30 March 2006
Firstpage
507
Lastpage
511
Abstract
SiGe-heterojunction bipolar transistors (HBTs) still sustain their leading RF-application position due to their good noise and HF properties. They also offer a relatively high operating voltage, which is limited by BVCEO, the emitter collector breakdown voltage with open base. We show that BVCER, the avalanche breakdown with a resistor RB connected to the base, can be used to define reliable operating conditions exceeding BVCEO. The measured BVCER data correlate very well with values calculated from basic transistor parameters and their corresponding multiplication factor data. The functionality of this concept is verified by investigating a power amplifier circuit used at emitter collector voltages exceeding BV CEO in operational mode enabling significant higher output power
Keywords
Ge-Si alloys; avalanche breakdown; heterojunction bipolar transistors; semiconductor device breakdown; semiconductor device reliability; HBT operating voltage; SiGe; avalanche breakdown; emitter collector breakdown voltage; heterojunction bipolar transistors; high operating voltage; multiplication factor data; power amplifier circuit; Avalanche breakdown; Bipolar transistors; Breakdown voltage; Circuits; Hafnium; High power amplifiers; Operational amplifiers; Power amplifiers; Power generation; Resistors; BVCBO; BVCEO; BVCER; HBT; SiGe; avalanche multiplication; breakdown voltage; hetero bipolar transistor; impact ionisation; safe operating area;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International
Conference_Location
San Jose, CA
Print_ISBN
0-7803-9498-4
Electronic_ISBN
0-7803-9499-2
Type
conf
DOI
10.1109/RELPHY.2006.251270
Filename
4017211
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