• DocumentCode
    2732303
  • Title

    BVCER - Increased Operating Voltage for SiGe HBTs

  • Author

    Kraft, Jochen ; Löffler, Bernhard ; Ribic, Nikolaus ; Wachmann, Ewald

  • Author_Institution
    Austriamicrosyst. AG, Unterpremstatten
  • fYear
    2006
  • fDate
    26-30 March 2006
  • Firstpage
    507
  • Lastpage
    511
  • Abstract
    SiGe-heterojunction bipolar transistors (HBTs) still sustain their leading RF-application position due to their good noise and HF properties. They also offer a relatively high operating voltage, which is limited by BVCEO, the emitter collector breakdown voltage with open base. We show that BVCER, the avalanche breakdown with a resistor RB connected to the base, can be used to define reliable operating conditions exceeding BVCEO. The measured BVCER data correlate very well with values calculated from basic transistor parameters and their corresponding multiplication factor data. The functionality of this concept is verified by investigating a power amplifier circuit used at emitter collector voltages exceeding BV CEO in operational mode enabling significant higher output power
  • Keywords
    Ge-Si alloys; avalanche breakdown; heterojunction bipolar transistors; semiconductor device breakdown; semiconductor device reliability; HBT operating voltage; SiGe; avalanche breakdown; emitter collector breakdown voltage; heterojunction bipolar transistors; high operating voltage; multiplication factor data; power amplifier circuit; Avalanche breakdown; Bipolar transistors; Breakdown voltage; Circuits; Hafnium; High power amplifiers; Operational amplifiers; Power amplifiers; Power generation; Resistors; BVCBO; BVCEO; BVCER; HBT; SiGe; avalanche multiplication; breakdown voltage; hetero bipolar transistor; impact ionisation; safe operating area;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7803-9498-4
  • Electronic_ISBN
    0-7803-9499-2
  • Type

    conf

  • DOI
    10.1109/RELPHY.2006.251270
  • Filename
    4017211