• DocumentCode
    2732322
  • Title

    Brain electrical impedance at various frequencies: the effect of hypoxia

  • Author

    Seoane, F. ; Lindecrantz, K. ; Olsson, T. ; Kjellmer, I. ; Flisberg, A. ; Bågenholm, R.

  • Author_Institution
    Sch. of Eng., Boras Univ. Coll., Sweden
  • Volume
    1
  • fYear
    2004
  • fDate
    1-5 Sept. 2004
  • Firstpage
    2322
  • Lastpage
    2325
  • Abstract
    Non-invasive multi-frequency measurements of transcephalic impedance, both reactance and resistance, can efficiently detect cell swelling of brain tissue and can be used for early detection of threatening brain damage. We have performed experiments on piglets to monitor transcephalic impedance during hypoxia. The obtained results have confirmed the hypothesis that changes in the size of cells modify the tissue impedance. During tissue inflammation after induced hypoxia, cerebral tissue exhibits changes in both reactance and resistance. Those changes are remarkably high, up to 71% over the baseline, and easy to measure especially at certain frequencies. A better understanding of the electrical behaviour of cerebral tissue during cell swelling would lead us to develop effective non-invasive clinical tools and methods for early diagnosis of cerebral edema and brain damage prevention.
  • Keywords
    bioelectric phenomena; biological tissues; brain; cellular biophysics; diseases; patient diagnosis; brain damage detection; brain electrical impedance; brain tissue; cell swelling; cerebral edema diagnosis; hypoxia; piglets; reactance; resistance; tissue inflammation; transcephalic impedance; Biological tissues; Biomembranes; Cells (biology); Electric resistance; Electrical resistance measurement; Frequency measurement; Immune system; Impedance measurement; Ischemic pain; Pediatrics; Bio-impedance; Brain Damage; Cell Swelling; Cerebral Edema; Hypoxia; Ischemia; Tissue inflammation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2004. IEMBS '04. 26th Annual International Conference of the IEEE
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-7803-8439-3
  • Type

    conf

  • DOI
    10.1109/IEMBS.2004.1403674
  • Filename
    1403674