Title :
Modeling & Monitoring of Product DPPM with Multiple Fail Modes
Author :
Anderson, Thomas J. ; Carulli, John M., Jr.
Author_Institution :
Texas Instrum., Inc., Dallas, TX
Abstract :
A method to model and de-rate product DPPM using existing production EFR (early failure rate) and burn-in data is proposed. This approach incorporates multiple classes of reliability fail modes. Changes in process, test, or design may then be employed to optimize product outgoing defect levels. These changes will be based on the defect acceleration kinetic parameters, instead of just the reliability fail-fraction or wafer sort yield. Monitoring of low part-per-million defects is also critical in maintaining general quality and a new method is discussed
Keywords :
Weibull distribution; failure analysis; production testing; remaining life assessment; Weibull distribution; acceleration parameters; burn-in data; conditional reliability; de-rate product DPPM; defect acceleration kinetic parameters; early failure rate; existing production EFR; multiple defects; multiple fail modes; optimize product; product defective part per million modeling; product defective part per million monitoring; reliability fail modes; reliability fail-fraction; wafer sort yield; Acceleration; Condition monitoring; Geophysical measurement techniques; Ground penetrating radar; Instruments; Kinetic theory; Production; Read-write memory; Stress; Testing; Burn-in; Weibull; acceleration parameters; conditional reliability; de-rated; extrinsic; multiple defects;
Conference_Titel :
Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-9498-4
Electronic_ISBN :
0-7803-9499-2
DOI :
10.1109/RELPHY.2006.251277
