Title :
Analysis of stochastic resonances in electromagnetic couplings to transmission lines
Author :
Sy, O.O. ; van Beurden, M.C. ; Michielsen, B.L.
Author_Institution :
Dept. of Electr. Eng., Eindhoven Univ. of Technol., Eindhoven
Abstract :
Resonances present in coupling phenomena between a randomly varying thin-wire transmission-line, and an electro-magnetic field are stochastically characterized. This is achieved by using the first 4 statistical moments in order to appreciate the intensity of the resonance phenomena. The stochastic method proposed is applied to a thin-wire transmission line connected to a variable impedance, and, undergoing random geometrically localized perturbations.
Keywords :
electromagnetic coupling; stochastic processes; transmission line theory; electro-magnetic field; electromagnetic couplings; stochastic method; stochastic resonances; thin-wire transmission-line; transmission lines; Boundary conditions; Dielectric losses; Electromagnetic analysis; Electromagnetic coupling; Error correction; Frequency domain analysis; Laplace equations; Stochastic resonance; Surface impedance; Transmission lines;
Conference_Titel :
Electromagnetic Compatibility, 2009 20th International Zurich Symposium on
Conference_Location :
Zurich
Print_ISBN :
978-3-9523286-4-4
DOI :
10.1109/EMCZUR.2009.4783383
