• DocumentCode
    2732702
  • Title

    Acceptance testing of BGA ball alloys

  • Author

    Allen, Aileen ; Henshall, Gregory ; Troxel, Kris ; Miremadi, Jian ; Benedetto, Elizabeth ; Holder, Helen ; Roesch, Michael

  • Author_Institution
    Hewlett-Packard Co., Palo Alto, CA, USA
  • fYear
    2010
  • fDate
    1-4 June 2010
  • Firstpage
    182
  • Lastpage
    187
  • Abstract
    The industry has seen the development of a wide range of new Pb-free BGA ball alloys. A significant element of uncertainty regarding these new alloys is the lack of defined data requirements for alloy acceptance. This paper describes recent efforts at Hewlett-Packard to develop Pb-free solder alloy testing requirements. To facilitate the standardization of alloy testing, the required tests are divided into three major areas. • Material properties • Solder joint reliability • Impact to manufacturing processes This paper presents the approach to assess the risk of using new Pb-free BGA ball alloys on printed circuit assemblies.
  • Keywords
    Assembly; Circuit testing; Manufacturing processes; Material properties; Materials reliability; Materials testing; Printed circuits; Soldering; Standardization; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2010 Proceedings 60th
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-6410-4
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2010.5490903
  • Filename
    5490903