DocumentCode
2732718
Title
A multiwavelet model for 2D object analysis and classification
Author
Paulik, M.J. ; Wang, Y.D.
Author_Institution
Dept. of Electr. Eng., Detroit Univ., MI, USA
fYear
1998
fDate
9-12 Aug 1998
Firstpage
383
Lastpage
386
Abstract
A multiwavelet based model utilizing the GHM scaling and wavelet functions has been developed for object classification. Multiwavelets are employed as they possess such important properties as orthogonality, symmetry, and compact support, which cannot be achieved simultaneously with scalar wavelet analysis. Additionally, multiwavelets allow the use of two or more inputs concurrently. In the context of shape analysis this permits modeling both coordinates of an object contour sequence. All these properties make multiwavelets an idea tool for object analysis and classification. The proposed algorithm is invariant to change in scaling, shifting, rotation, and starting point. The scaling function expansion coefficients, which contain maximum energy, are used as features for object classification. Experimental results demonstrate the model´s efficacy
Keywords
image classification; object recognition; wavelet transforms; 2D object analysis; 2D object classification; GHM scaling; multiwavelet model; object contour sequence; orthogonality; scaling function expansion coefficients; shape analysis; symmetry; wavelet functions; Context modeling; Electrical capacitance tomography; Energy resolution; Fourier transforms; Image coding; Signal analysis; Signal processing; Signal processing algorithms; Signal resolution; Wavelet analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1998. Proceedings. 1998 Midwest Symposium on
Conference_Location
Notre Dame, IN
Print_ISBN
0-8186-8914-5
Type
conf
DOI
10.1109/MWSCAS.1998.759511
Filename
759511
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