• DocumentCode
    2732718
  • Title

    A multiwavelet model for 2D object analysis and classification

  • Author

    Paulik, M.J. ; Wang, Y.D.

  • Author_Institution
    Dept. of Electr. Eng., Detroit Univ., MI, USA
  • fYear
    1998
  • fDate
    9-12 Aug 1998
  • Firstpage
    383
  • Lastpage
    386
  • Abstract
    A multiwavelet based model utilizing the GHM scaling and wavelet functions has been developed for object classification. Multiwavelets are employed as they possess such important properties as orthogonality, symmetry, and compact support, which cannot be achieved simultaneously with scalar wavelet analysis. Additionally, multiwavelets allow the use of two or more inputs concurrently. In the context of shape analysis this permits modeling both coordinates of an object contour sequence. All these properties make multiwavelets an idea tool for object analysis and classification. The proposed algorithm is invariant to change in scaling, shifting, rotation, and starting point. The scaling function expansion coefficients, which contain maximum energy, are used as features for object classification. Experimental results demonstrate the model´s efficacy
  • Keywords
    image classification; object recognition; wavelet transforms; 2D object analysis; 2D object classification; GHM scaling; multiwavelet model; object contour sequence; orthogonality; scaling function expansion coefficients; shape analysis; symmetry; wavelet functions; Context modeling; Electrical capacitance tomography; Energy resolution; Fourier transforms; Image coding; Signal analysis; Signal processing; Signal processing algorithms; Signal resolution; Wavelet analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1998. Proceedings. 1998 Midwest Symposium on
  • Conference_Location
    Notre Dame, IN
  • Print_ISBN
    0-8186-8914-5
  • Type

    conf

  • DOI
    10.1109/MWSCAS.1998.759511
  • Filename
    759511