DocumentCode
2732729
Title
Mechanical analysis and reliability enhancement of a Proximity Communication flip chip package
Author
Guenin, Bruce ; Shi, Jing
Author_Institution
Oracle, San Diego, CA, USA
fYear
2010
fDate
1-4 June 2010
Firstpage
194
Lastpage
199
Abstract
Proximity Communication is a technology that enables high-bandwidth chip-to-chip signaling using dense arrays of metal pads that are capacitively coupled to the corresponding pads on the neighboring chip. To successfully deploy Proximity Communication requires limiting chip x-y misalignment and separation to be less than 8 µm and maintaining these tolerances over many temperature cycles. This paper examines these requirements in light of test results and detailed mechanical modeling to both understand the performance of existing package designs and to identify design modifications that lead to improved performance.
Keywords
Assembly; Bonding; Bridge circuits; Circuit testing; Flip chip; Packaging machines; Semiconductor device measurement; Temperature distribution; Temperature sensors; Thermal stresses;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC), 2010 Proceedings 60th
Conference_Location
Las Vegas, NV, USA
ISSN
0569-5503
Print_ISBN
978-1-4244-6410-4
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2010.5490905
Filename
5490905
Link To Document