• DocumentCode
    2732729
  • Title

    Mechanical analysis and reliability enhancement of a Proximity Communication flip chip package

  • Author

    Guenin, Bruce ; Shi, Jing

  • Author_Institution
    Oracle, San Diego, CA, USA
  • fYear
    2010
  • fDate
    1-4 June 2010
  • Firstpage
    194
  • Lastpage
    199
  • Abstract
    Proximity Communication is a technology that enables high-bandwidth chip-to-chip signaling using dense arrays of metal pads that are capacitively coupled to the corresponding pads on the neighboring chip. To successfully deploy Proximity Communication requires limiting chip x-y misalignment and separation to be less than 8 µm and maintaining these tolerances over many temperature cycles. This paper examines these requirements in light of test results and detailed mechanical modeling to both understand the performance of existing package designs and to identify design modifications that lead to improved performance.
  • Keywords
    Assembly; Bonding; Bridge circuits; Circuit testing; Flip chip; Packaging machines; Semiconductor device measurement; Temperature distribution; Temperature sensors; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2010 Proceedings 60th
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-6410-4
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2010.5490905
  • Filename
    5490905