DocumentCode :
2732818
Title :
TTCN-3 Test Data Analyser Using Constraint Programming
Author :
Vega, Diana ; Din, George ; Schieferdecker, Ina
Author_Institution :
Tech. Univ. Berlin, Berlin
fYear :
2008
fDate :
19-21 Aug. 2008
Firstpage :
498
Lastpage :
507
Abstract :
This paper presents the idea of analyzing and refining the test data variance computation as a method to determine the quality of TTCN-3 tests. TTCN-3 as the only internationally standardized testing language is being used extensively by industry. A large amount of functional test specifications are written in this language. For this reason, a sensible issue is the quality analysis of these specifications. Data variance characterizes the test data distribution over the test system interface. TTCN-3 template distance constitutes the criterion to quantify the variance: "similar"and "different enough" test data. Due to the high flexibility of the language, the stimuli templates to be compared may not only contain concret evalues but also variables, function calls, parameters, values which are known at runtime only, etc. Therefore, we combine constraint programming (CP) with static analysis of TTCN-3 test suites targeting a realistic template solving. We name template constraint an expression whose value (or domain restrictions) can only be determined by looking at the execution paths in the analyzed test behavior. This method leads to a better computation of the data distance and, thus, to a better refinement of similarity classes. The approach is illustrated by an example which shows how data varies when the distance is computed taking into account the template constraints.
Keywords :
constraint handling; program diagnostics; program testing; specification languages; TTCN-3 test data analyser; constraint programming; functional test specification; standardized testing language; static analysis; test data variance computation; test system interface; Analysis of variance; Computer industry; Concrete; Data analysis; Data engineering; ISO standards; Refining; Runtime; System testing; Systems engineering and theory; CSP; TTCN-3; Template Distance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Systems Engineering, 2008. ICSENG '08. 19th International Conference on
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-0-7695-3331-5
Type :
conf
DOI :
10.1109/ICSEng.2008.74
Filename :
4616687
Link To Document :
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