The Malfunction and Immunity limit of Information technology equipment under HPEM environments

Author

Sekiguchi, Hidenori ; Seto, Shinji ; Minematsu, Ikuya

Author_Institution

Security Fundamentals Group, Nat. Inst. of Inf. & Commun. Technol., Koganei

fYear

2009

fDate

12-16 Jan. 2009

Firstpage

69

Lastpage

72

Abstract

This paper presents the investigation results of the relation with the malfunction and the immunity limit of an Ethernet hub that is put in the high-power electromagnetic (HPEM) environments. Several HPEM environments are built to induce the malfunction of the Ethernet hub. First, the radiated HPEM environments are built using a transverse electromagnetic (TEM) cell. Next, the conducted HPEM environment was built using a bulk current injection (BCI) method. From these test experiments, it is discussed on the relation with the malfunction and the immunity limit of the Ethernet hub.

Keywords

TEM cells; electromagnetic waves; information technology; local area networks; Ethernet hub; HPEM environments; bulk current injection; immunity limit; information technology equipment; malfunction; transverse electromagnetic cell; Electromagnetic compatibility; Electromagnetic devices; Electromagnetic radiation; Ethernet networks; Immunity testing; Information security; Information technology; Local area networks; Performance analysis; TEM cells;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 2009 20th International Zurich Symposium on

Conference_Location

Zurich

Print_ISBN

978-3-9523286-4-4

Type

conf

DOI

10.1109/EMCZUR.2009.4783392

Filename

4783392