DocumentCode :
27329
Title :
Electrical characteristics of nanometer gaps in vacuum under direct voltage
Author :
Meng, Guang ; Cheng, Yuan Bing ; Wu, Kaijie ; Chen, Luo-nan
Author_Institution :
Xi´an Jiaotong University State Key Laboratory of Electrical Insulation and Power Equipment 28 Xianning West Road Xi´an 710049, China
Volume :
21
Issue :
4
fYear :
2014
fDate :
Aug-14
Firstpage :
1950
Lastpage :
1956
Abstract :
The electrical characteristics of nanometer gaps in vacuum were studied with the tungsten electrodes under dc and pulsed voltage. A novel experimental technique to study the electrical characteristics of nanometer gaps was presented in the paper. In the experimental setup, the tungsten was fabricated and shaped to be a perfect sphere through the electrochemical etch and Joule melting method, and the nanogap was controlled precisely by the scanning electron microscope (SEM) and nanometer manipulator. The effects of electrode geometry, gap separation and injected voltage waveform were investigated. The current-voltage curves and Fowler-Nordheim plots showed the difference of the field emission process before breakdown between the sphere-sphere electrodes and needlesphere electrodes. The gap separation dependence of dielectric strength demonstrated the similar trend to the previous work but better performance. The breakdown voltage for pulsed voltage was 4-5 times higher than that for the dc voltage. The analysis of the physical damage indicated that the current, duration time and electrode geometry played important roles in electrode modification. In addition, a possible mechanism of nanoscale vacuum breakdown was also proposed in the paper.
Keywords :
Breakdown voltage; Cathodes; Geometry; Tungsten; Vacuum breakdown; Electrical characteristics; electrical breakdown; electrode geometry; field emission.; gap separation; nanometer gaps; pulsed voltage; vacuum;
fLanguage :
English
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9878
Type :
jour
DOI :
10.1109/TDEI.2014.004376
Filename :
6878028
Link To Document :
بازگشت