• DocumentCode
    27329
  • Title

    Electrical characteristics of nanometer gaps in vacuum under direct voltage

  • Author

    Meng, Guang ; Cheng, Yuan Bing ; Wu, Kaijie ; Chen, Luo-nan

  • Author_Institution
    Xi´an Jiaotong University State Key Laboratory of Electrical Insulation and Power Equipment 28 Xianning West Road Xi´an 710049, China
  • Volume
    21
  • Issue
    4
  • fYear
    2014
  • fDate
    Aug-14
  • Firstpage
    1950
  • Lastpage
    1956
  • Abstract
    The electrical characteristics of nanometer gaps in vacuum were studied with the tungsten electrodes under dc and pulsed voltage. A novel experimental technique to study the electrical characteristics of nanometer gaps was presented in the paper. In the experimental setup, the tungsten was fabricated and shaped to be a perfect sphere through the electrochemical etch and Joule melting method, and the nanogap was controlled precisely by the scanning electron microscope (SEM) and nanometer manipulator. The effects of electrode geometry, gap separation and injected voltage waveform were investigated. The current-voltage curves and Fowler-Nordheim plots showed the difference of the field emission process before breakdown between the sphere-sphere electrodes and needlesphere electrodes. The gap separation dependence of dielectric strength demonstrated the similar trend to the previous work but better performance. The breakdown voltage for pulsed voltage was 4-5 times higher than that for the dc voltage. The analysis of the physical damage indicated that the current, duration time and electrode geometry played important roles in electrode modification. In addition, a possible mechanism of nanoscale vacuum breakdown was also proposed in the paper.
  • Keywords
    Breakdown voltage; Cathodes; Geometry; Tungsten; Vacuum breakdown; Electrical characteristics; electrical breakdown; electrode geometry; field emission.; gap separation; nanometer gaps; pulsed voltage; vacuum;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/TDEI.2014.004376
  • Filename
    6878028