• DocumentCode
    2732978
  • Title

    Millimeter-wave/THz passive components design using through silicon via (TSV) technology

  • Author

    Hu, Sanming ; Wang, Lei ; Xiong, Yong-Zhong ; Shi, Jinglin ; Zhang, Bo ; Zhao, Dan ; Lim, Teck Guan ; Yuan, Xiaojun

  • Author_Institution
    Inst. of Microelectron., A*STAR (Agency for Sci., Technol. & Res.), Singapore, Singapore
  • fYear
    2010
  • fDate
    1-4 June 2010
  • Firstpage
    520
  • Lastpage
    523
  • Abstract
    The 3-D integration using through silicon vias (TSVs) is expected to realize compact circuits and systems with high performance and multi-functionality. Based on the TSV technology, a hairpin bandpass filter and a microstrip patch antenna for millimeter-wave (mmW)/terahertz (THz) application are designed and presented in this paper. Additionally, a novel TSV-based solution for the integration of antennas with front-end circuits is proposed. The TSV-based hairpin bandpass filter has the insertion loss of 6.9 dB at 120 GHz with 20 GHz passband from 110 to 130 GHz, whereas the filter size is only 300 × 250 × 50 µm. The designed antenna is with 10-dB impedance bandwidth of 137 to 146 GHz, the boresight directivity and antenna gain is 3.49 dBi and −3.16 dBi, respectively, and the radiation efficiency is 21.6% which is around twice than that of many conventional on-chip antennas. The TSV-based integration solution is expected to reduce not only the total chip size but also the electromagnetic interference (EMI) effect, which are major concerns in the mmW/THz systems.
  • Keywords
    Band pass filters; Circuits and systems; Electromagnetic interference; Microstrip antennas; Microstrip filters; Millimeter wave circuits; Millimeter wave technology; Silicon; Submillimeter wave technology; Through-silicon vias;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2010 Proceedings 60th
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-6410-4
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2010.5490919
  • Filename
    5490919