Title :
Automated characterization of SiP MZI-based switches
Author :
Hai, Mohammed Shafiqul ; Fard, Monireh Moayedi Pour ; An, Dong ; Gambini, Fabrizio ; Faralli, Stefano ; Preve, Giovan Battista ; Roberts, Gordon W. ; Liboiron-Ladouceur, Odile
Author_Institution :
Dept. of Electr. & Comput. Eng., McGill Univ., Montreal, QC, Canada
Abstract :
A testing methodology for commercial automated test equipment (ATE) conventionally used for electrical integrated circuits is developed for photonic integrated circuits. The method is assessing by efficiently characterizing a packaged low-port optical switch matrix.
Keywords :
Mach-Zehnder interferometers; elemental semiconductors; integrated optics; optical switches; optical testing; silicon; ATE; Mach-Zehnder interferometer; Si; SiP MZI-based switches; automated test equipment; electrical integrated circuits; packaged low-port optical switch matrix; photonic integrated circuits; silicon photonics; Optical crosstalk; Optical switches; Photonics; Ports (Computers); Testing; Transmission line matrix methods; Integrated optics devices; Optical switching devices; Testing;
Conference_Titel :
Optical Interconnects Conference (OI), 2015 IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4799-8178-6
DOI :
10.1109/OIC.2015.7115695
