DocumentCode
2733119
Title
Automated characterization of SiP MZI-based switches
Author
Hai, Mohammed Shafiqul ; Fard, Monireh Moayedi Pour ; An, Dong ; Gambini, Fabrizio ; Faralli, Stefano ; Preve, Giovan Battista ; Roberts, Gordon W. ; Liboiron-Ladouceur, Odile
Author_Institution
Dept. of Electr. & Comput. Eng., McGill Univ., Montreal, QC, Canada
fYear
2015
fDate
20-22 April 2015
Firstpage
94
Lastpage
95
Abstract
A testing methodology for commercial automated test equipment (ATE) conventionally used for electrical integrated circuits is developed for photonic integrated circuits. The method is assessing by efficiently characterizing a packaged low-port optical switch matrix.
Keywords
Mach-Zehnder interferometers; elemental semiconductors; integrated optics; optical switches; optical testing; silicon; ATE; Mach-Zehnder interferometer; Si; SiP MZI-based switches; automated test equipment; electrical integrated circuits; packaged low-port optical switch matrix; photonic integrated circuits; silicon photonics; Optical crosstalk; Optical switches; Photonics; Ports (Computers); Testing; Transmission line matrix methods; Integrated optics devices; Optical switching devices; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Optical Interconnects Conference (OI), 2015 IEEE
Conference_Location
San Diego, CA
Print_ISBN
978-1-4799-8178-6
Type
conf
DOI
10.1109/OIC.2015.7115695
Filename
7115695
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