Setup for Measuring the Derating of SMD Components under ESD Stress

This paper presents a mechanical setup for measuring the derating of surface mounted devices. The derating is caused here by single or multiple electrostatic discharges from common simulator equipment. In the field, electrostatic discharges potentially damage or destroy the input circuitry of electronic control units. Often only secondary effects such as system malfunctions or reduced electromagnetic compatibility indicate a derating of the input circuitry from previous electrostatic discharges. Within the setup presented here, the device under test is placed into a two-port coaxially interfaced container fit for all common electrical characterisation methods, such as impedance and network analysis. The design features standard Pellegrini flange dimensions and is therefore suitable for manual or semi-automatic test implementations within already existing electrostatic test setups.