• DocumentCode
    2733180
  • Title

    Fracture mechanics of lead-free solder joints under cyclic shear load

  • Author

    Xu, Huili ; Bang, Woong Ho ; Ma, Hong-Tao ; Lee, Tae-Kyu ; Liu, Kuo-Chuan ; Kim, Choong-Un

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Univ. of Texas at Arlington, Arlington, TX, USA
  • fYear
    2010
  • fDate
    1-4 June 2010
  • Firstpage
    484
  • Lastpage
    489
  • Abstract
    This paper reports the experimental and theoretical exploration of the fracture mechanism active in BGA lead-free solder assemblies under high speed shear fatigue test conditions. Our investigation finds that, contrary to common assumption, the crack growth in shear fatigue is not governed by shear stress but more by crack opening stress. Our theoretical analysis indicates that fracture by crack opening mode prevails because non-uniformity in the shear deformation of solder joint creates a body rotation which results in crack opening stress rather than shear. While the crack growth in shear fatigue is found to vary sensitively with variation in the mechanical constraints on the assembly, such as solder shape and elastic modulus of the chip mold, it is also sensitive to variation in solder microstructure. This, the sensitivity to the assembly constraints and solder microstructure, makes it ideal in investigating fatigue properties of solder joints as well as identifying the structural and microstructural features responsible for reliability failure.
  • Keywords
    Assembly; Capacitive sensors; Environmentally friendly manufacturing techniques; Fatigue; Lead; Materials science and technology; Microstructure; Soldering; Stress; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2010 Proceedings 60th
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-6410-4
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2010.5490928
  • Filename
    5490928