Title :
A 560 megaword per second digital test generator
Author :
Lautier, Patrick ; Gille, Louis
Author_Institution :
Centre Ind. de Caen, France
Abstract :
A high-speed digital word generator, which can be used for tests of communication links and digital electronic assemblies, has been designed using semicustom ECL/CML cell arrays. The main features of this instrument are: output rate of 560 megawords per second (NRZ); programmable sequence length, of up to 512 words; selection of word width in multiples of 5 bits by paralleling the basic building blocks; and generation of start and stop signals at the beginning and end of the sequence. The basic building blocks of the instrument, which are described in detail, are two types of commercially available. TTL- and ECL-compatible arrays. Each of them includes 1000 gates with an equivalent delay of 350 ps and 1280 bits of RAM with a maximum access time of 4 ns
Keywords :
automatic test equipment; cellular arrays; digital instrumentation; electronic equipment testing; emitter-coupled logic; logic testing; signal generators; transistor-transistor logic; 1280 bits; 350 ps; 4 ns; ECL compatible arrays; TTL compatible arrays; digital electronic assemblies; digital test generator; high-speed digital word generator; logic testing; semicustom ECL/CML cell arrays; tests of communication links; Clocks; Counting circuits; Delay; Instruments; Logic arrays; Logic circuits; Logic design; Read-write memory; Testing; Timing;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1988. IMTC-88. Conference Record., 5th IEEE
Conference_Location :
San Diego, CA
DOI :
10.1109/IMTC.1988.10891
