Title :
AlGaAsSb-InGaAsSb-GaSb epitaxial heterostructures for uncooled infrared detectors
Author :
Sulima, Oleg V. ; Datta, Sarbajit ; Cox, Jeff A. ; Mauk, Michael G. ; Rafol, Sir B.
Author_Institution :
AstroPower Inc., Newark, DE, USA
Abstract :
Lattice matched n-type AlGaAsSb-InGaAsSb-GaSb heterostructures for uncooled infrared detectors, including separate absorption and multiplication avalanche photodiodes (SAM-APD), as well as low-voltage InGaAsSb APDs, were grown using inexpensive liquid phase epitaxy. Formation of the pn-junction was performed through diffusion of Zn from the vapor phase. Responsivity at λ=2 μm as high as 3.5 A/W was achieved in InGaAsSb APD biased at 8 V with the avalanche multiplication starting at 6 V. Our calculations have shown that the above parameters can result in a NEP value as low as 1×10-12 W or D* value as high as 2×1010 cm×Hz12//W at room temperature for 400 μm diameter (200 μm diameter photoactive area) APDs.
Keywords :
III-V semiconductors; aluminium compounds; avalanche breakdown; avalanche photodiodes; diffusion; gallium compounds; indium compounds; infrared detectors; liquid phase epitaxial growth; semiconductor device manufacture; semiconductor device measurement; 1E-12 W; 2 micron; 20 degC; 200 micron; 400 micron; 6 V; 8 V; AlGaAsSb-InGaAsSb-GaSb; AlGaAsSb/InGaAsSb/GaSb epitaxial heterostructures; AlGaAsSb:Zn; LPE; NEP; SAM-APD; avalanche multiplication; biased APD responsivity; infrared detectors; lattice matched n-type heterostructures; liquid phase epitaxy; low-voltage InGaAsSb APD; photoactive area diameter; pn-junction formation; room temperature operation; separate absorption/multiplication avalanche photodiodes; uncooled IR detectors; vapor phase Zn diffusion; Boats; Electrons; Epitaxial growth; Impurities; Infrared detectors; Lattices; Optical device fabrication; Photodetectors; Temperature; Zinc;
Conference_Titel :
High Performance Devices, 2002. Proceedings. IEEE Lester Eastman Conference on
Print_ISBN :
0-7803-7478-9
DOI :
10.1109/LECHPD.2002.1146768