• DocumentCode
    2733318
  • Title

    Alternative patterning techniques enabling fine pitch interconnection on topography surfaces

  • Author

    Iker, F. ; Funaya, T. ; Jamieson, G. ; Beyne, E.

  • Author_Institution
    IMEC, Leuven, Belgium
  • fYear
    2010
  • fDate
    1-4 June 2010
  • Firstpage
    431
  • Lastpage
    434
  • Abstract
    We report on the fabrication of small pitch (20 µm) interconnection structures based on Cu pillars embedded in polymer. Such structures are useful in different applications such as integrated passives and die embedding technologies. To allow the fabrication of such structures, we made use of the diamond bit cutting and dry etching techniques as alternatives to the currently used lithographic process. This latter did not allow targeting such aggressive pitches and structures dimensions.
  • Keywords
    Dielectrics; Dry etching; Lithography; National electric code; Optical device fabrication; Polymers; Rough surfaces; Stacking; Surface roughness; Surface topography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2010 Proceedings 60th
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-6410-4
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2010.5490935
  • Filename
    5490935