DocumentCode
2733318
Title
Alternative patterning techniques enabling fine pitch interconnection on topography surfaces
Author
Iker, F. ; Funaya, T. ; Jamieson, G. ; Beyne, E.
Author_Institution
IMEC, Leuven, Belgium
fYear
2010
fDate
1-4 June 2010
Firstpage
431
Lastpage
434
Abstract
We report on the fabrication of small pitch (20 µm) interconnection structures based on Cu pillars embedded in polymer. Such structures are useful in different applications such as integrated passives and die embedding technologies. To allow the fabrication of such structures, we made use of the diamond bit cutting and dry etching techniques as alternatives to the currently used lithographic process. This latter did not allow targeting such aggressive pitches and structures dimensions.
Keywords
Dielectrics; Dry etching; Lithography; National electric code; Optical device fabrication; Polymers; Rough surfaces; Stacking; Surface roughness; Surface topography;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC), 2010 Proceedings 60th
Conference_Location
Las Vegas, NV, USA
ISSN
0569-5503
Print_ISBN
978-1-4244-6410-4
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2010.5490935
Filename
5490935
Link To Document