Title :
Characterization of solar cell degradation due to electrostatic discharge on multi-junction solar cell
Author :
Okumura, Teppei ; Imaizumi, Mitsuru ; Toyoda, Kazuhiro ; Cho, Mengu
Author_Institution :
Japan Aerosp. Exploration Agency, Tsukuba, Japan
Abstract :
A shunt resistance on the solar cell edge which is made by an electrostatic discharge (discharge) causes the degradation of multi-junction solar cell (MJ cell). To prevent the degradation, a trench was formed along the edge of multi-junction solar cell (AD MJ cell). The degradation characterization tests were performed on state-of art MJ cell and AD MJ cell to investigate the effect of trench in plasma environment.
Keywords :
electrostatic discharge; solar cells; electrostatic discharge; multijunction solar cell; plasma environment; shunt resistance; solar cell degradation; solar cell edge; trench effect; Discharges;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-5890-5
DOI :
10.1109/PVSC.2010.5614144
